Method and Apparatus for High Efficiency X-ray Imager

Background

X-ray imaging experienced a ?digital revolution? in the early 2000s, with digital radiography systems being implemented with active matric flat panel images. Due to the compact size, rapid image readout and excellent image quality, AMFPI is being used not only for traditional x-ray imaging modalities such as general radiography and fluoroscopy, but also in tomographic imaging applications.

Technology

The detectors proposed here provide an improved dynamic range and sensitivity which is required in digital radiography. Improving optical photon conversion efficiency provides practical advantages for both avalanche and non-avalanche embodiments of the scintillator.

Advantages

This technology improves the quantum efficiency of indirect and hybrid x-ray imagers where optical photons need to be converted to electronic charge. The improvement in quantum efficiency can be orders of magnitude for green and red wavelengths.

Application

Radiology - Nanotechnology - Sensors

Patent Status

Patent application submitted

Stage Of Development

US Provisional Filed

Licensing Potential

Development partner - Commercial partner - Licensing

Licensing Status

Exclusive License - All Fields

Additional Info

Additional Information:

https://stonybrook.technologypublisher.com/files/sites/050-8934---method-and-apparatus-for-high-efficiency-x-ray-imager.jpg Source: Jonathan Borba, unsplash.com/photos/v_2FRXEba94, Unsplash Licence
Patent Information:
Case ID: R050-8934
For Information, Contact:
Donna Tumminello
Assistant Director
State University of New York at Stony Brook
6316324163
donna.tumminello@stonybrook.edu
Inventors:
Wei Zhao
Amirhossein Goldan
Adrian Howansky
Anthony Lubinsky
James Scheurmann
Jann Stavro
Keywords:
Charge sensing
Fabrication
High Efficiency Cadmium Selenide
Multi-well
Selenium
Selenium Avalanche Multiplication Gain
Technologies
Unipolar Time-Differential (UTD)