Hybrid Active Matrix Flat Panel Imager

Background

X-ray detectors currently commercially available consist of direct and indirect detectors. Direct detectors take x-ray inputs and are directly converted to electron hole pairs and digitized through the readout electronics. Common photoconductors are amorphous selenium. Indirect detectors use a phosphor screen to later convert x-rays to optical photons, absorbed in a photodiode and digitized. Higher energy applications and current photoconductors do not have sufficient quantum efficiency.

Technology

This invention is a new hybrid detector where incident x-rays are absorbed via both direct interactions in the photoconductor and indirect interaction in the scintillator. This method enables the photoconductor to sense both x-rays and optical photons. The hybrid structure results in spatial resolution and dose efficiency improvement beyond current direct and indirect detectors.

Advantages

The newly proposed model as compared to current direct and indirect detectors available has better spatial resolution, improved dose efficiency and higher absorption efficiency combined with high spatial resolution resulting in better detective quantum.

Application

Radiology

Patent Status

Patent application submitted Publication US-2019-0388042-A1

Stage Of Development

 

Licensing Potential

Development partner - Commercial partner - Licensing 

Licensing Status

Available for License. Stony Brook University seeks to develop and commercialize by an exclusive or non-exclusive license agreement and/or sponsored research with a company active in the area.

Additional Info

Additional Information:

https://stonybrook.technologypublisher.com/files/sites/050-8886-hybrid-active-matrix-flat-panel-imager.jpg Source: Yurok Aleksandrovich, stock.adobe.com/uk/2003066, stock.adobe.com
Patent Information:
Case ID: R050-8886
For Information, Contact:
Donna Tumminello
Assistant Director
State University of New York at Stony Brook
6316324163
donna.tumminello@stonybrook.edu
Inventors:
Anthony Lubinsky
Wei Zhao
Adrian Howansky
James Scheuermann
Keywords:
direct detector
indirect detector
Selenium
Technologies
x-ray detector