Compact Spectrometer for X-rays

Background

An x-ray spectrometer is an optical device used to resolve and select different x-ray photon energies. The x-ray spectrometer operates by using a diffractive crystal. A von Hamos x-ray spectrometer includes an x-ray source defined by a rectangular slit, a cylindrical bent crystal, and a position sensitive detector located on a crystal axis of curvature. The von Hamos geometry permits the spectrometer to collect data over an energy bandwidth. Different crystals are used at different angular specifications to allow the spectrometer to observe x-rays.

Technology

The spectrometer focusing apparatus incorporates a hollow cylinder for x-rays to traverse a length thereof and a defracting element configured as a ring on an interior circumference of a portion forming a hollow cylinder. To resolve the drawbacks and disadvantages of current conventional systems, the apparatus provides a portable device that uses only an apparatus formed along a perimeter of a disk to limit an angle of incidence. One disk edge is utilized as a defining circle aligned with the defracting element, causing an aperture to be formed between the defracting element and the edge of the one disk

Advantages

-A smaller size allows for a versatile and portable approach of x ray designs - A small cost has allowed an affordable accessory to spectroscopy and imaging facilities - New spectrometer works with simple counting or solid state detectors

Application

Device enhances and improves existing instruments and facilities as an accessory for standard X-ray detectors.

Patent Status

   

Stage Of Development

   

Licensing Potential

-Development partner - Commercial partner - Licensing

Licensing Status

Available for license. Stony Brook University is seeking to develop and commercialize, by an exclusive or non-exclusive license agreement and/or sponsored research, with a company active in the area.

Additional Info

Additional Information:

https://stonybrook.technologypublisher.com/files/sites/8582-compact-spectrometer-for-x-rays.jpg Source: Sergey Ryzhov, https://stock.adobe.com/uk/205333850, stock.adobe.com 
Patent Information:
Case ID: R8582
For Information, Contact:
Donna Tumminello
Assistant Director
State University of New York at Stony Brook
6316324163
donna.tumminello@stonybrook.edu
Inventors:
Paul Northrup
Keywords:
diffraction
Technologies
X-ray fluorescence
X-ray spectrometer