Compact and high numerical aperture near-field microscopy based on piezo-probes

Background


The study of low energy excitations in quantum materials often relies on scattering-type scanning near-field optical microscopy at cryogenic temperatures (cryo-SNOM). Constructing such an apparatus is a daunting task, requiring the simultaneous accommodation of numerous fine-tuned components within a confined space. Furthermore, maintaining cryogenic temperatures is complicated by enhanced radiative heating from light sources, hindering the achievement of very low operating temperatures.

Technology


Researchers at Stony Brook University developed a piezo-based cryo-SNOM system employing metal-coated Akiyama probes for tip actuation and detection. Unlike cantilever-based AFM probes that use laser-based detection, this method relies on electrical means or a combination of mechanical excitation and electrical detection for the tip's oscillation. This design enables a compact system with high spatial resolution and near-field contrast, reducing the need for extensive high vacuum components and addressing challenges related to component accommodation and thermal management in cryogenic environments.

Advantages

  • Enhanced integration flexibility
  • Reduced system complexity
  • Improved spatial resolution
  • Reduced vacuum requirements
  • Versatile platform capabilities

Application

  • Advanced Materials and Nanoscale Research
  • Integration and Upgrade of Cryogenic Microscopy Systems
  • Specialized Nanoscale Imaging Services

Patent Status


PCT Application Filed

Stage Of Development


Prototype Available

Licensing Potential


Development partner - Commercial partner - Licensing

Licensing Status


Available 

Additional Info


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Patent Information:
Case ID: R050-9256
For Information, Contact:
James Martino
Licensing Specialist
State University of New York at Stony Brook
james.martino@stonybrook.edu
Inventors:
Michael Dapolito
Mengkun Liu
Xinzhong Chen
Keywords: