Automated EXAFS Spectra Interpretation
Background
Extended X-ray absorption fine structure (EXAFS) spectroscopy is a critical technique for determining the local atomic structure of nanoparticle catalysts, particularly during dynamic operando studies, but the traditional analytical workflow relies on iterative non-linear least squares fitting that presents significant operational bottlenecks. This conventional approach is computationally intensive and inherently slow, requiring expert manual intervention to establish initial parameter guesses, which makes it ill-suited for real-time data analysis or high-throughput processing essential for maximizing limited synchrotron beamtime. Furthermore, standard fitting algorithms are highly sensitive to experimental noise and spectral artifacts, often leading to convergence failures or unreliable results due to strong correlations between structural parameters, such as coordination numbers and Debye-Waller factors, thereby hindering the automation required for modern, data-intensive materials research.
Technology
This invention employs a multilayer perceptron (MLP) neural network to rapidly extract four critical structural parameters—coordination number, bond length shift, Debye-Waller factor, and energy shift—from extended X-ray absorption fine structure (EXAFS) spectra of nanoparticle catalysts. By training on synthetic data generated from theoretical models (FEFF and Larch) and utilizing interpolated k-space data with Fourier transforms, the system achieves novelty by bypassing traditional, iterative non-linear least squares fitting methods. This approach eliminates the need for initial parameter guesses and mitigates issues related to noise sensitivity and parameter correlation, ultimately enabling real-time, robust predictions with uncertainty estimates derived via a Laplace approximation.
By automating the First-Shell EXAFS analysis with the rigor of a Hessian-based uncertainty model, this framework effectively packages expert-level analysis into a software program that offers useful data and insights for non-experts. The leap from spectrum data to calculations of the exact number of atoms with an error bar is a distinct, non-obvious utility that serves a needed industrial purpose.
Advantages
Real-time Analysis Capability: The neural network approach enables rapid, real-time extraction of structural parameters from EXAFS spectra, significantly reducing analysis time compared to traditional non-linear least squares fitting methods, which are time-consuming and less suited for high-throughput applications.
Enhanced Robustness to Noise: By training on synthetic data with varied parameters and augmented noise, the neural network demonstrates resilience to experimental noise and artifacts, maintaining high accuracy where conventional fitting methods often struggle.
Reduced Parameter Correlation: The neural network approach minimizes issues related to parameter correlation inherent in traditional fitting methods, leading to more reliable extraction of structural parameters from EXAFS spectra.
Automation and Scalability: The method’s ability to process large datasets without manual intervention facilitates seamless integration into automated experimental workflows, enhancing scalability over traditional least squares fitting approaches.
Uncertainty Estimation: Incorporating a Laplace approximation, the neural network provides uncertainty estimates for its predictions, offering a level of confidence in the results that is comparable to traditional methods.
Application
Synchrotron beamlines – real-time data pipelines that provide “operando” (real-time) analysis results alongside raw spectra, greatly enhancing beamline efficiency and usability for researchers. This means researchers can now spot problems or make improvements during the experiment, not hours or days later.
Laboratory EXAFS spectrometers – manufacturers can integrate this technology to make their instruments more powerful and user-friendly for broader markets.
General materials research – faster structural insights across catalysis, energy materials, semiconductors, and nanomaterials development, where real-time analysis accelerates discovery.
Educational and training settings – lowering the expertise barrier by automating complex analysis, making EXAFS more accessible to non-specialists.
Patent Status
Patent application submitted
Stage Of Development
In Silico
Licensing Potential
Development partner - Commercial partner - Licensing
Licensing Status
Stony Brook University is seeking an industry partner to license and commercialize the technology.
Additional Info
Additional Information:
https://stonybrook.technologypublisher.com/files/sites/050-9531.jpg
peterschreiber.media, https://stock.adobe.com/uk/229322356, stock.adobe.com
Patent Information:
| App Type |
Country |
Serial No. |
Patent No. |
File Date |
Issued Date |
Expire Date |
|
|
|
Inventors:
Keywords:
|